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Please use this identifier to cite or link to this item: http://repo.knmu.edu.ua/handle/123456789/18930

Название: Effective thickness of the planar detector in measurements of electrons energy loss
Авторы: Deiev, Oleksey
Kiprich, S.
Vasiliev, G.
Yalovenko, V.
Ovchinnik, V.
Shulika, M.
Ключевые слова: cross-section
spectra of energy losses.
Landau approximation
Issue Date: 12-Dec-2017
Библиографическое описание: Effective thickness of the planar detector in measurements of electrons energy loss / O. S. Deiev, S. K. Kiprich, G. P. Vasilyev, V. I. Yalovenko, V. D. Ovchinnik, M. Y. Shulika // Problems of Atomic Science and Technology. Series: Nuclear Physics Investigations. – 2017. – № 3 (109). – Р. 45–49.
Серия/номер: 109;3
Аннотация: An experimental method of determining the active region thickness of Si planar detector was used. The method based on the dependence the depletion layer thickness from voltage applied to the detector (U = 0:::60 V ). The electron energy loss spectra emitted by 90Sr 􀀀90 Y in silicon planar detector were measured. The relative values of most probable energy loss of electrons were de ned for different thickness of detector. The planar detector was considered as a parallel-plate capacitor. The static (capacity) and dynamic (the detection efficiency and the energy deposit) characteristics had a root dependence on voltage.
URI: http://repo.knmu.edu.ua/handle/123456789/18930
ISSN: 1562-6016
Appears in Collections:Наукові праці. Кафедра медичної та біологічної фізики і медичної інформатики

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